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Join date: May 18, 2022

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the title bar. After clicking on the 'Create a netlist' button it returns 'Capturing of EDA data to Capture.CADP has failed. Retry or cancel' and



 

Orcad Capture 16.2 Hotfix


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CAP[0000] When opening Orcad for the first time in my 16.2 capture it seems to work fine and reports 'Creating a netlist: Accessing Capture' in the title bar. After clicking on the 'Create a netlist' button it returns 'Capturing of EDA data to Capture.CADP has failed. Retry or cancel' and a dialog 'Capturing of EDA data to Capture.CADP has failed' appears. The next time I open Orcad I now have the same error and the dialog appears for the first time and again after clicking the create button How can I resolve this issue? I have tried to reinstall the 16.2 version in another account and checked if capture/open a capture file worked but it was the same problem. I have also tried to use the generated netlist and imported it into my design, but this also returns the same error. A: I've managed to solve this by using a 16.6 trial. After closing Orcad completely and reopen it (that is: launch orcad, delete the capture file from the desktop) then launch a 16.6 trial and run Capture, it works fine. After this, launch a 16.3 trial, run Capture and it again doesn't work. In the 16.6 trial, at the end of the capture dialogue it reports that the capture "has failed" with CAP[0020]. In the 16.3 trial however it reports "Capture of EDA data to Capture.CADP has succeeded" and the netlist is generated. Alignment of poly(vinylidene fluoride) thin-film deposited on n-ZnO:Eu3+ glass via a shear-assisted spin-coating process. The shear-assisted spin-coating process was used to successfully align poly(vinylidene fluoride) (PVDF) thin-film deposited on glass with nano-patterned surface, which can be applied in lighting and laser applications. The surface morphology and roughness of PVDF thin-film was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM), respectively. The thickness of PVDF film was measured by optical interference method, and the degree of alignment was measured by cross-sectional SEM observations. The results demonstrated that the shear-assisted spin-coating process could effectively control the growth




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Orcad Capture 16.2 Hotfix

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